simultaneous x‐ray diffraction and tomography

Three

Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis W. Ludwig,1,2 P. Reischig,2 A. King,2,3 M. Herbig,1 E. M. Lauridsen,4 G. Johnson,2,3 T. J. Marrow,3 and J. Y. Buffire1 1Universit de Lyon, INSA-Lyon, MATEIS CNRS UMR 5510, 69621Villeurbanne, France

Diffraction Contrast Tomography (DCT)

Advances in X-ray diffraction contrast tomography: flexibility in the setup geometry and application to multiphase materials. Journal of Applied Crystallography 46, 297--311 (2013). Library Safety User portal Staff login Site maps Legal/Credits Contacts Staff web

Simultaneous X

Maike Becker, Gabrielle Regula, Guillaume Reinhart, Elodie Boller, Jean-Paul Valade, et al.. Simultaneous X-ray radiography and diffraction topography imaging applied to silicon for defect analysis during melting and crystallization. Journal of Applied Crystallography, International Union of Crystallography, 2019, 52 (6), 10.1107/S1600576719013050 .

Tomographic Femtosecond X

A method is proposed for obtaining three simultaneous projections of a target from a single radiation pulse, which also allows the relative orientation of successive targets to be determined. The method has application to femtosecond x-ray diffraction, and does not require solution of the phase problem. We show that the principal axes of a compact charge-density distribution can be obtained

Three

Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis W. Ludwig,1,2 P. Reischig,2 A. King,2,3 M. Herbig,1 E. M. Lauridsen,4 G. Johnson,2,3 T. J. Marrow,3 and J. Y. Buffire1 1Universit de Lyon, INSA-Lyon, MATEIS CNRS UMR 5510, 69621Villeurbanne, France

(IUCr) Interlaced X

An X-ray diffraction computed tomography data-collection strategy that allows, post experiment, a choice between temporal and spatial resolution is reported. This strategy enables time-resolved studies on comparatively short timescales, or alternatively allows for improved spatial resolution if the system under study, or components within it, appear to be unchanging.

Simultaneous X

2018/2/1Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector Author links open overlay panel Henry J. Kirkwood a Martin D. de Jonge b Ondrej Murnsky c d Felix Hofmann e Daryl L. Howard b Chris G. Ryan f Grant van Riessen g Matthew R. Rowles h Anna M. Paradowska i Brian Abbey a

Phys. Rev. Lett. 101, 115507 (2008)

A method is proposed for obtaining three simultaneous projections of a target from a single radiation pulse, which also allows the relative orientation of successive targets to be determined. The method has application to femtosecond x-ray diffraction, and does not require solution of the phase problem. We show that the principal axes of a compact charge-density distribution can be obtained

Advances in X‐ray diffraction contrast tomography:

Diffraction contrast tomography is a near‐field diffraction‐based imaging technique that provides high‐resolution grain maps of polycrystalline materials simultaneously with the orientation and average elastic strain tensor components of the individual grains with an .

Simultaneous X‐Ray Diffraction and Tomography

2.2 Operando X‐Ray Tomography The lattice expansion of the graphite upon AlCl 4 − intercalation leads to a volumetric variation at the microscale of the graphite electrode. [ 24 ] The setup used in the present experiments allows following the structural evolution of the compound by ED‐XRD and the electrode morphology evolution by the acquisition of tomographic images simultaneously.

IUCr scripts server

The principles of a novel technique for nondestructive and simultaneous mapping of the three-dimensional grain and the absorption microstructure of a material are explained. The technique is termed X-ray diffraction contrast tomography, underlining its similarity to conventional X-ray absorption contrast tomography with which it shares a common experimental setup.

Three

Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis W. Ludwig,1,2 P. Reischig,2 A. King,2,3 M. Herbig,1 E. M. Lauridsen,4 G. Johnson,2,3 T. J. Marrow,3 and J. Y. Buffire1 1Universit de Lyon, INSA-Lyon, MATEIS CNRS UMR 5510, 69621Villeurbanne, France

Simultaneous X

X-ray radioscopy/tomography and simultaneous energy-dispersive diffraction are presented and applied to study the evolution of an evolving liquid metal foam. A correlation between bubble formation, foam expansion, foam density evolution, lattice parameters and intermetallic phases can be found.

Simultaneous Tomography and Diffraction Analysis of Creep

Diffraction provides complementary infor-mation to tomography, e.g., about texture (orientation distribution of the crystallites), changes in domain size, dislocation density, and internal strains respectively internal stresses. Normally, x-ray diffraction is performed

IUCr scripts server

By simultaneous acquisition of the transmitted and the diffracted beams, the applicability of the previously introduced diffraction contrast tomography technique [Ludwig, Schmidt, Lauridsen Poulsen (2008). J. Appl. Cryst. 41, 302-309] can be extended to the case of undeformed polycrystalline samples containing more than 100 grains per cross section.

IVPL Simultaneous 3D X

Project Overview The acquisition model of a 3D x-ray imaging system can be understood as the combination of two known techniques: tomography and ptychography. First, x-rays go through a 3Dobject producing a set of 2D tomographic projections at different angles. Then, a detector captures the magnitude of a diffraction pattern produced by the interaction of these projections with a finite

IVPL Simultaneous 3D X

Project Overview The acquisition model of a 3D x-ray imaging system can be understood as the combination of two known techniques: tomography and ptychography. First, x-rays go through a 3Dobject producing a set of 2D tomographic projections at different angles. Then, a detector captures the magnitude of a diffraction pattern produced by the interaction of these projections with a finite

(IUCr) Interlaced X

An X-ray diffraction computed tomography data-collection strategy that allows, post experiment, a choice between temporal and spatial resolution is reported. This strategy enables time-resolved studies on comparatively short timescales, or alternatively allows for improved spatial resolution if the system under study, or components within it, appear to be unchanging.

OSA

We combine diffraction and absorption tomography by raster scanning samples through a hollow cone of pseudo monochromatic X-rays with a mean energy of 58.4 keV. A single image intensifier takes 90x90 (x,y) snapshots during the scan. We demonstrate a proof-of-principle of our technique using a heterogeneous three-dimensional (x,y,z) phantom (90x90x170 mm3) comprised of different material

Tomographic femtosecond x

2008/9/12A method is proposed for obtaining three simultaneous projections of a target from a single radiation pulse, which also allows the relative orientation of successive targets to be determined. The method has application to femtosecond x-ray diffraction, and does not require solution of

SIMULTANEOUS 3D X

The acquisition model of a 3Dx-ray imaging system can be understood as the combination of two known techniques: tomography and ptychography. First, x-rays go through a 3D object producing a set of 2D tomographic projections at different angles. Then, a detector captures the magnitude of a diffraction pattern produced by the interaction of these projections with a finite-sized coherent beam

SIMULTANEOUS 3D X

SIMULTANEOUS 3D X-RAY PTYCHO-TOMOGRAPHY WITH GRADIENT DESCENT Semih Barutcu1, Pablo Ruiz1, Florian Schiffers2, Selin Aslan3 Doga Gursoy1,3, Oliver Cossairt1,2, Aggelos K. Katsaggelos1 1Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL 60208, USA

Tomographic femtosecond x

2008/9/12A method is proposed for obtaining three simultaneous projections of a target from a single radiation pulse, which also allows the relative orientation of successive targets to be determined. The method has application to femtosecond x-ray diffraction, and does not require solution of

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